S. Murphy

An accessible electrical impedance tomograph for 3D imaging

Bruce Grieve, S. Murphy, A. Burnett-Thompson, 2010 .

Performance and Variability Comparisons between Multi-Gate FETs and Planar SOI Transistors

J. Conner, S. Murphy, S. Venkatesan, 2006, 2006 International Electron Devices Meeting.

Uniaxial-biaxial stress hybridization for super-critical strained-si directly on insulator (SC-SSOI) PMOS with different channel orientations.

S. Murphy, S. Venkatesan, M. Ramon, 2005, IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..

Strain-Enhanced CMOS Through Novel Process-Substrate Stress Hybridization of Super-Critically Thick Strained Silicon Directly on Insulator (SC-SSOI)

J. Conner, C. Mazure, S. Murphy, 2006, 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers..

Performance and reliability of sub-100nm TaSiN metal gate fully-depleted SOI devices with high-k (HfO/sub 2/) gate dielectric

A. Vandooren, S. Murphy, I. To, 2004, Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004..

Embedded SiGe S/D PMOS on thin body SOI substrate with drive current enhancement

M. Mendicino, S. Murphy, S. Venkatesan, 2005, Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..