Ken Shono

High Voltage GaN Switch Reliability FIT rates and PPM reliability based on standards from: Joint Electron Device Engineering Council (JEDEC), Automotive Electronics Council (AEC) and German Electrical and Electronic Manufacturers' Association (ZVEI)

Kurt Smith, Peter Smith, Elena Georgieva, 2018, 2018 IEEE 6th Workshop on Wide Bandgap Power Devices and Applications (WiPDA).

SEILA: Soft error immune latch for mitigating multi-node-SEU and local-clock-SET

Keiji Takahisa, Kichiji Hatanaka, Yoshiharu Tosaka, 2010, 2010 IEEE International Reliability Physics Symposium.