Chae-Bog Rim
发表
Intra-metal leakage reliability characteristics for line/via in copper/low-k interconnect structures
Hyunsoo Kim,
Jeung-Woo Kim,
Nam-Hyung Lee,
2002,
IEEE International Integrated Reliability Workshop Final Report, 2002..
Chul-Hee Jeon,
Chae-Bog Rim,
Sam-Young Kim,
2002,
IEEE International Integrated Reliability Workshop Final Report, 2002..
Kyoung-sik Moon,
Chae-Bog Rim,
Seungbae Lee,
2000,
IEEE International Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.00CH37016).