C. Wong

Characterization and mitigation of overlay error on silicon wafers with nonuniform stress

Nelson Felix, Pradeep Vukkadala, Sathish Veeraraghavan, 2014, Advanced Lithography.

A novel design of integrated proximity sensors for the white cane

Iain Murray, T. Dias, C. Wong, 2001, The Seventh Australian and New Zealand Intelligent Information Systems Conference, 2001.