E. Gourvest

Impact of local back biasing on performance in hybrid FDSOI/bulk high-k/metal gate low power (LP) technology

O. Faynot, F. Andrieu, N. Planes, 2012, 2012 13th International Conference on Ultimate Integration on Silicon (ULIS).

Carbon-doped GeTe Phase-Change Memory featuring remarkable RESET current reduction

G. Reimbold, D. Blachier, A. Toffoli, 2010, 2010 Proceedings of the European Solid State Device Research Conference.

Impact of Oxidation on Ge2Sb2Te5 and GeTe Phase-Change Properties

Sylvain Maitrejean, Sandrine Lhostis, Christophe Vallée, 2012 .

Carbon-doped GeTe: A promising material for Phase-Change Memories

G. Reimbold, Sylvain Maitrejean, D. Blachier, 2011 .

On Carbon doping to improve GeTe-based Phase-Change Memory data retention at high temperature

G. Reimbold, D. Blachier, A. Toffoli, 2010, 2010 IEEE International Memory Workshop.

N-doped GeTe as performance booster for embedded Phase-Change Memories

G. Reimbold, D. Blachier, A. Toffoli, 2010, 2010 International Electron Devices Meeting.