Jean-Pierre Colinge

Nondestructive Characterization of Soi Wafers Using Spectroscopic Reflectometry

P. Smeys, U. Magnusson, Jean-Pierre Colinge, 1993 .

High frequency four noise parameters of Silicon-on-Insulator-based technology MOSFET: Prospects for application to low noise RF integrated circuits

Jean-Pierre Raskin, L. Picheta, Danielle Vanhoenacker-Janvier, 1999 .