Perambur S. Neelakantaswamy

ESD (Electrostatic Discharge)/EOS (Electrical Overstress) Susceptibility of a Class of Bipolar RF Power Transistors: Experimental Studies on Stripline-Opposed Emitter Transistors

Perambur S. Neelakantaswamy, Ibrahim R. Turkman, 1986 .

RESIDUAL FATIGUES IN MICROELECTRONIC DEVICES DUE TO THERMOELASTIC STRAINS CAUSED BY REPETITIVE ELECTRICAL OVERSTRESSINGS: A MODEL FOR LATENT FAILURES.

Tapan K. Sarkar, Perambur S. Neelakantaswamy, Ibrahim R. Turkman, 1985 .

A non-invasive, partial-body exposure method for measuring the complex permittivity of biological substances at microwave frequencies

Perambur S. Neelakantaswamy, P. Neelakantaswamy, K. Gupta, 1978, Medical and Biological Engineering and Computing.

MOSFET analysis through numerical solution of Poisson's equation by the method of moments

R. I. Turkman, E. Arvas, Perambur S. Neelakantaswamy, 1987 .