Ibrahim R. Turkman

ESD (Electrostatic Discharge)/EOS (Electrical Overstress) Susceptibility of a Class of Bipolar RF Power Transistors: Experimental Studies on Stripline-Opposed Emitter Transistors

Perambur S. Neelakantaswamy, Ibrahim R. Turkman, 1986 .

RESIDUAL FATIGUES IN MICROELECTRONIC DEVICES DUE TO THERMOELASTIC STRAINS CAUSED BY REPETITIVE ELECTRICAL OVERSTRESSINGS: A MODEL FOR LATENT FAILURES.

Tapan K. Sarkar, Perambur S. Neelakantaswamy, Ibrahim R. Turkman, 1985 .