Hajime Tomokage

Fabrication of system with probe for high‐frequency measurement applications

Keiji Matsumoto, Woon Choi, Hajime Tomokage, 2010 .

Defect Characterization in Metal-Oxide-Semiconductor Field-Effect-Transistors with Trench Gates by Electron Beam-Induced Current Technique

Masahiro Kawakami, Hajime Tomokage, Y. Ishiwata, 1998 .

Three States of Substitutional Gold in Silicon

Masayuki Yoshida, Hajime Kitagawa, Hajime Tomokage, 1985 .

Experimental Study of Uniaxial-Stress Effects on DC Characteristics of nMOSFETs

Toru Ikeda, Noriyuki Miyazaki, Masaaki Koganemaru, 2010, IEEE Transactions on Components and Packaging Technologies.