Kim T. Le

A Novel Approach for Testing Memories Using a Built-In Self Testing Technique

Kewal K. Saluja, Kim T. Le, K. T. Le, 1986, International Test Conference.

Reduction of target fault list for crosstalk-induced delay faults by using layout constraints

Hiroshi Takahashi, Kewal K. Saluja, Yuzo Takamatsu, 2002, Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02)..

Testable design of large random access memories

Kewal K. Saluja, Kim T. Le, 1984, Integr..

Privacy Assurances in Multiple Data-Aggregation Transactions

Parameswaran Ramanathan, Kewal K. Saluja, Kim T. Le, 2013, ICISC.

Privacy Assurance in Data-Aggregation for Multiple MAX Transactions

Parameswaran Ramanathan, Kewal K. Saluja, Kim T. Le, 2015, 2015 IEEE 39th Annual Computer Software and Applications Conference.

A concurrent fault simulation for crosstalk faults in sequential circuits

Kewal K. Saluja, Kim T. Le, Marong Phadoongsidhi, 2002, Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02)..

A method for reducing the target fault list of crosstalk faults in synchronous sequential circuits

Hiroshi Takahashi, Kewal K. Saluja, Yuzo Takamatsu, 2005, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Test Time Reduction to Test for Path-Delay Faults using Enhanced Random-Access Scan

Dong Hyun Baik, Kewal K. Saluja, Kim T. Le, 2007, 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07).

A Heuristic Measure to Maximize Detected Faults per Test

Kewal K. Saluja, Kim T. Le, K. T. Le, 1998, J. Electron. Test..