J.L. Pelloie

On the Noise in Dynamic Threshold (DT) MOS/SOI Transistors

F. Balestra, J. Jomaah, S. Haendler, 2000, 30th European Solid-State Device Research Conference.

Full and automated determination of MOS transistor parameters in the linear region

J.L. Pelloie, 1990, International Conference on Microelectronic Test Structures.

MOS Transistors on SOI Substrate: On-Wafer Measurement for Small-Signal Parameters Extraction Procedure

D. Pasquet, N. Fel, V. Ferlet-Cavrois, 1999, 1999 29th European Microwave Conference.

Using SOI to achieve low-power consumption in digital

J.L. Pelloie, 2005, 2005 IEEE International SOI Conference Proceedings.