J.-L. Gauffier

Oxide charge measurements in EEPROM devices

Romain Desplats, Philippe Perdu, Felix Beaudoin, 2005, Microelectron. Reliab..

Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards

Romain Desplats, Philippe Perdu, C. Guérin, 2006, Microelectron. Reliab..