M J Gadlage
发表
B L Bhuva,
L W Massengill,
B Narasimham,
2010,
IEEE Transactions on Nuclear Science.
B L Bhuva,
R D Schrimpf,
B Narasimham,
2011,
IEEE Transactions on Device and Materials Reliability.
B L Bhuva,
R A Reed,
R D Schrimpf,
2011,
IEEE Transactions on Nuclear Science.
The Effect of Layout Topology on Single-Event Transient Pulse Quenching in a 65 nm Bulk CMOS Process
B L Bhuva,
R A Reed,
J R Ahlbin,
2010,
IEEE Transactions on Nuclear Science.