P. Tobin

Integration challenges of new materials and device architectures for IC applications

M. Mendicino, A. Vandooren, Da Zhang, 2004, 2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866).

Parallel hot-carrier-induced degradation mechanisms in hydrogen-passivated polysilicon-on-insulator LDD p-MOSFET's

S. Bhattacharya, B.-Y. Nguyen, P. Tobin, 1992, IEEE Electron Device Letters.