J.-J. Yang

Influence of model footing diameter and embedded depth on particle size effect in centrifugal bearing capacity tests

Yasuo Toyosawa, Kazuya Itoh, Naotaka Kikkawa, 2013 .

Snapback circuit model for cascoded NMOS ESD over-voltage protection structures

J.-J. Yang, V. Vassilev, G. Groeseneken, 2003, ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003..

A CAD assisted design and optimisation methodology for over-voltage ESD protection circuits

Michiel Steyaert, Guido Groeseneken, J.-J. Yang, 2004, Microelectron. Reliab..

Accurate MOS device hot carrier models for VLSI reliability simulation

Steve S. Chung, J.-J. Yang, J.-S. Su, 1995, Proceedings of the IEEE 1995 Custom Integrated Circuits Conference.

A Calibrated Physically-based Model For Sulbmiclron MOS Process And Device Simulations

C.-H. Lee, J.-J. Yang, Steve S. Chung, 1992, 1992 Proceedings of the IEEE Custom Integrated Circuits Conference.