Mototsugu Okushima

Inductor-based ESD protection under CDM-like ESD stress conditions for RF applications

Mirko Scholz, Dimitri Linten, Jonathan Borremans, 2008, 2008 IEEE Custom Integrated Circuits Conference.

CDM secondary clamp of RX and TX for high speed SerDes application in 40nm CMOS technology

Mototsugu Okushima, Junji Tsuruta, M. Okushima, 2011, EOS/ESD Symposium Proceedings.

Secondary ESD clamp circuit for CDM protection of over 6 Gbit/s SerDes application in 40 nm CMOS

Mototsugu Okushima, Junji Tsuruta, 2013, Microelectron. Reliab..

Low-Leakage and Variable VHOLD Power Clamp for Wide Stress Time Range From ESD to Surge Test

Mototsugu Okushima, Koki Narita, 2020, IEEE Transactions on Device and Materials Reliability.

Cross domain protection analysis and verification using whole chip ESD simulation

Tomohiro Kitayama, Susumu Kobayashi, Mototsugu Okushima, 2010, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010.