Takaaki Hagiwara

发表

Yield and reliability of MNOS EEPROM products

Ken Uchida, Kazunori Furusawa, Takeshi Furuno, 1989 .

Permanent semiconductor memory

Takaaki Hagiwara, Shinichi Minami, Yuji Yatsuda, 1978 .

むだ時間系に対するロバスト安定化修正繰返し補償器のパラメトリゼーション(機械力学,計測,自動制御)

Iwanori Murakami, Takaaki Hagiwara, Tatsuya Sakanushi, 2010 .

A byte erasable 5V-only 64 kbit EEPROM

Ken Uchida, Takaaki Hagiwara, Shinichi Minami, 1984 .

A method for generating a memory nichtfluechtigen

Takaaki Hagiwara, Shinichi Minami, Ryuji Kondo, 1979 .

Experiment of the Slide Door Automatic Opening and Shutting with the Sensor and Examination of the Sound Function by Using Raspberry Pi

Takaaki Hagiwara, Yuuta Umezawa, 2017 .

compensation technique for multiple-input/m ultiple-output systems

Takaaki Hagiwara, Kou Yamada, Takaaki Hagiwara, 2011 .

Hi-MNOS II technology for a 64-kbit byte-erasable 5-V-only EEPROM

Ken Uchida, Masaaki Terasawa, S. Minami, 1985 .

One-dimensional table look-up model for sub-μm MOS transistors

Takaaki Hagiwara, H. Masuda, Hitoshi Matsuo, 1986 .

Scaling Down MNOS Nonvolatile Memory Devices

Takaaki Hagiwara, Shinichi Minami, Ryuji Kondo, 1982 .

Improvement of Written-State Retentivity by Scaling Down MNOS Memory Devices : Silicon Devices and Process Technologies( Solid State Devices and Materials 1)

Kazunori Furusawa, Yoshiaki Kamigaki, Takaaki Hagiwara, 1988 .

Device performance degradation due to hot carriers having energies below the Si‐SiO2 energy barrier

Takaaki Hagiwara, E. Takeda, Norio Suzuki, 1984 .

n-channel Si-gate MNOS Device for High Speed EAROM

Takaaki Hagiwara, Shinichi Minami, Ryuji Kondo, 1979 .

Effects of High Temperature Hydrogen Annealing on n-Channel Si-Gate MNOS Devices

Takaaki Hagiwara, Shinichi Minami, Ryuji Kondo, 1980 .

Threshold Voltage Deviation in Very Small MOS Transistors Due to Local Impurity Fluctuations

Shojiro Asai, Takaaki Hagiwara, Ken Yamaguchi, 1982, 1982 Symposium on VLSI Technology. Digest of Technical Papers.