Bruno Ricco

发表

Layout dependence of CMOS latchup

Roberto Menozzi, Luca Selmi, Enrico Sangiorgi, 1988 .

Design of CMOS self-checking sequential circuits with improved detectability of bridging faults

Cecilia Metra, Bruno Ricco, Michele Favalli, 1994 .

Automatic and continuous offset compensation of MOS operational amplifiers using floating-gate transistors

Bruno Ricco, M. Lanzoni, G. Tondi, 1998 .

Three-dimensional effects in dynamically triggered CMOS latchup

Luca Selmi, Enrico Sangiorgi, Bruno Ricco, 1989 .

Feasibility of Lactobacilli Concentration Detec- tion in Beer by Automated Impedance Technique

Bruno Ricco, M. Lanzoni, G. Perretti, 2012 .

Design of an X-band transformer-coupled amplifier with improved stability and layout

Luca Selmi, Bruno Ricco, 1993 .

Enhanced reliability evaluation for self-checking circuits

Cecilia Metra, Bruno Ricco, 1994 .

Evaluation of E2PROM data retention by field acceleration

Roberto Menozzi, Bruno Ricco, M. Lanzoni, 1991 .

Reliability of GaAs MESFETs

Bruno Ricco, P. Brambilla, Fausto Fantini, 1990 .

Multilevel Flash Memories

Guido Torelli, Bruno Ricco, M. Lanzoni, 1999 .

Novel 1-out-of-n CMOS checker

Cecilia Metra, Bruno Ricco, Michele Favalli, 1994 .

Latch-up testing in CMOS IC's

Roberto Menozzi, Bruno Ricco, M. Lanzoni, 1990 .

Practical Determination of Solid Fat Content in Fats and Oils by Single-Wavelength Near-Infrared Analysis

Bruno Ricco, Marco Grossi, Pietro Rocculi, 2020, IEEE Transactions on Instrumentation and Measurement.

A novel technique to control ice cream freezing by electrical characteristics analysis

Bruno Ricco, M. Lanzoni, Marco Grossi, 2011 .

Scaling the MOS transistor below 0.1 /spl mu/m: methodology, device structures, and technology requirements

Enrico Sangiorgi, Bruno Ricco, Hiroshi Iwai, 1994 .

A novel electrochemical method for olive oil acidity determination

Bruno Ricco, Tullia Gallina Toschi, Marco Grossi, 2013, IWASI.

Monte Carlo Analysis of Velocity Overshoot Effects in Bipolar Devices with and without an i-Layer (Special Issue on 1993 VLSI Process and Device Modeling Workshop (VPAD93))

Bruno Ricco, Hiroshi Iwai, Enrico Sangiorgi, 1994 .

Numerical analysis of the gate voltage dependence of the series resistances and effective channel length in submicrometer GaAs MESFETs

Roberto Menozzi, Luca Selmi, Bruno Ricco, 1992 .