Jamil J. Clarke

A novel approach to TEM preparation with a (7-axis stage) triple-beam FIB-SEM system

Jamil J. Clarke, 2015, SPIE Scanning Microscopies.

Novel Workflow for Improved Throughput, Turnaround Time, and Cross Section Preparation of Microelectronic Devices

Atsushi Muto, Akinari Morikawa, Takeshi Sunaoshi, 2020, Microscopy and Microanalysis.

Impact-induced shock and the formation of natural quasicrystals in the early solar system

Jamil J. Clarke, P. Steinhardt, N. Yao, 2014, Nature Communications.