X. Aymerich
发表
M. Nafría,
J. Suñé,
X. Aymerich,
1993
.
Marc Porti,
Montserrat Nafría,
X. Aymerich,
2002
.
Javier Martin-Martinez,
Gabriella Ghidini,
A. Paccagnella,
2008
.
X. Blasco,
X. Aymerich,
J. Pétry,
2005,
Microelectron. Reliab..
M. Nafria,
X. Aymerich,
J. Sune,
2000,
IEEE Electron Device Letters.
M. Nafria,
X. Aymerich,
J. Sune,
1999,
IEEE Electron Device Letters.
Jordi Suñé,
Nuria Barniol,
X. Aymerich,
1989
.
M. Nafria,
X. Aymerich,
J. Sune,
1998,
International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217).
E. Simoen,
J. Martin-Martinez,
M. Nafria,
2010,
2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology.
G. Abadal,
N. Barniol,
F. Pérez-Murano,
1998
.
A. Volodin,
M. Nafria,
W. Vandervorst,
2008,
2008 IEEE International Reliability Physics Symposium.
R. Degraeve,
M. Nafria,
G. Groeseneken,
2009,
IEEE Transactions on Device and Materials Reliability.
Jordi Suñé,
X. Aymerich,
Montserrat Nafria,
1995
.
M. Nafria,
W. Vandervorst,
X. Blasco,
2005,
IEEE Transactions on Electron Devices.
Jordi Suñé,
Nuria Barniol,
X. Aymerich,
1989,
February 16.
R. Degraeve,
M. Nafria,
G. Groeseneken,
2008,
2008 9th International Conference on Ultimate Integration of Silicon.
Charge trapping and degradation of HfO/sub 2//SiO/sub 2/ MOS gate stacks observed with enhanced CAFM
M. Nafria,
M. Porti,
X. Aymerich,
2006,
IEEE Electron Device Letters.
M. Nafria,
X. Aymerich,
J. Sune,
1999,
IEEE Electron Device Letters.
R. Degraeve,
M. Nafria,
G. Groeseneken,
2009,
2009 Spanish Conference on Electron Devices.
M. Porti,
B. Hamilton,
M. Nafría,
2010,
The Review of scientific instruments.
G. Ghidini,
S. Gerardin,
A. Paccagnella,
2009,
IEEE Transactions on Electron Devices.
F. Campabadal,
M. Nafria,
M. Porti,
2011,
IEEE Transactions on Device and Materials Reliability.
Jordi Suñé,
Nuria Barniol,
X. Aymerich,
1990
.
A. Crespo-Yepes,
J. Martin-Martinez,
M. Nafria,
2010,
2010 Proceedings of the European Solid State Device Research Conference.
G. Ghidini,
M. Nafria,
A. Sebastiani,
2009,
IEEE Transactions on Device and Materials Reliability.
Jordi Suñé,
X. Aymerich,
E. Farrés,
1991
.
Marc Porti,
Alessandro Paccagnella,
Simone Gerardin,
2007
.