J. C. Braatz

A rad-hard analog CMOS cell library

J. Holic, D. R. Hogue, G. A. Perry, 2000, 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527).

ASIC design system for radiation environments

M. L. White, J. C. Braatz, 1991, [1991] Proceedings Fourth Annual IEEE International ASIC Conference and Exhibit.

Single event upset test structures for digital CMOS application specific integrated circuits

J. C. Braatz, M. P. Baze, W. G. Bartholet, 1993 .