Gabriele Luca Donadio

Variability study with CD-SEM metrology for STT-MRAM: correlation analysis between physical dimensions and electrical property of the memory element

Takeyoshi Ohashi, Atsuko Yamaguchi, Osamu Inoue, 2017, Advanced Lithography.

Enabling CD SEM metrology for 5nm technology node and beyond

Gian Francesco Lorusso, Naoto Horiguchi, Christopher J. Wilson, 2017, Advanced Lithography.

Enhanced data integrity of In-Ga-Zn-Oxide based Capacitor-less 2T memory for DRAM applications

Wim Dehaene, Jérôme Mitard, Romain Delhougne, 2021, ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC).