Matthew Hogan

FinFET MPSoC 32 Gb/s transceivers: Custom ESD protection and verification

James Karp, Michael J. Hart, Mohammed Fakhruddin, 2016, 2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS).

Electromigration analysis of full-chip integrated circuits with hydrostatic stress

Matthew Hogan, Valeriy Sukharev, Patrick Gibson, 2014, 2014 IEEE International Reliability Physics Symposium.

Physics to Tapeout: The Challenge of Scaling Reliability Verification

Matthew Hogan, Sridhar Srinivasan, 2019, 2019 IEEE International Reliability Physics Symposium (IRPS).

Passive Aggressive Education: Infusing Passive House Principles into the Curriculum

Matthew Hogan, Malini Srivastava, Kwok G Kwok, 2013 .

Using static voltage analysis and voltage-aware DRC to identify EOS and oxide breakdown reliability issues

Matthew Hogan, Dina Medhat, Sridhar Srinivasan, 2013, 2013 35th Electrical Overstress/Electrostatic Discharge Symposium.

Reduce Verification Complexity In Low/Multi-Power Designs

Matthew Hogan, 2013 .