Steven Lippy

Reclaiming copper/low-k control wafers during development of 0.13- and 0.10-μm devices

Stephen Reid, Edit Braunstein, Daniele Gilkes, 2002, MICRO 2002.

Selective co growth on Cu for void-free via fill

John Zhu, Mustafa Badaroglu, William Hunks, 2015, 2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM).