Yoshinobu Kimura

New method for simulating charging effects on specimens in electron beam testing

Hiroshi Hayashi, Naoto Kihara, Noriyuki Ishihara, 2001, SPIE Optics + Photonics.

Low-on-resistance strain-controlled LDMOS transistors for 0.25-μm power ICs

Nobuyuki Sugii, Yoshinobu Kimura, Masafumi Miyamoto, 2011, 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs.

Optimum Light Intensity Distribution for Growing Large Si Grains by Phase-Modulated Excimer-Laser Annealing

Masayuki Jyumonji, Masakiyo Matsumura, Masato Hiramatsu, 2004 .

Analysis of charging effects on highly resistive materials under electron irradiation by using transient-absorbed-current method

Hiroshi Makino, Hiroyuki Shinada, Hiroya Ohta, 2011 .

Ultrahigh Electron Mobilities in Si1-xGex/Si/Si1-xGex Heterostructures with Abrupt Interfaces Formed by Solid-Phase Epitaxy

Nobuyuki Sugii, Shinya Yamaguchi, Masanobu Miyao, 1998 .