C. Boit
发表
C. Boit,
C. Boit,
2008,
2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
C. Boit,
S. Tajik,
P. Scholz,
2016,
2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
C. Boit,
2002,
Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614).
C. Boit,
1999,
Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394).
Rudolf Schlangen,
C. Boit,
Ted Lundquist,
2009,
2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
C. Boit,
P. Egger,
U. Kerst,
2008,
2008 IEEE International Electron Devices Meeting.
C. Boit,
U. Kerst,
R. Schlangen,
2007,
2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
C. Boit,
B. Ebersberger,
A. Olbrich,
1998,
1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173).
C. Boit,
G. Woods,
U. Kindereit,
2007,
IEEE Transactions on Device and Materials Reliability.
C. Boit,
C. Boit,
S.K. Brahma,
2004,
2004 IEEE International Reliability Physics Symposium. Proceedings.
C. Boit,
C. Boit,
H. Suzuki,
2007,
IEEE Transactions on Device and Materials Reliability.
C. Boit,
B. Ebersberger,
G. Zimmermann,
2003
.
C. Boit,
P. Perdu,
A. Glowacki,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
C. Boit,
U. Kerst,
T. Lundquist,
2007,
2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
C. Boit,
C. Boit,
R. Leihkauf,
2006,
2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
C. Boit,
R. Sittig,
F. Lau,
1990
.
C. Boit,
U. Kerst,
R. R. Vardanyan,
2012
.
C. Boit,
A. Dallmann,
J. Kolzer,
1990,
28th Annual Proceedings on Reliability Physics Symposium.
C. Boit,
G. Woods,
U. Kindereit,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
C. Boit,
E. Langer,
U. Kerst,
2010,
2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
C. Boit,
I. De Wolf,
F. Altmann,
2019,
Microelectronics Reliability.
C. Boit,
T. Nakamura,
K. Croes,
2018,
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).