H. A. Ferwerda

发表

Physical Backgrounds Of Laser Inspection Of Surface Roughness

H. A. Ferwerda, 1989, Other Conferences.

Reconstruction Of The Permittivity Profile Of A Stratified Dielectric Layer

David Yevick, H. A. Ferwerda, E. Vogelzang, 1985, Other Conferences.

PROBLEM OF PHASE RETRIEVAL IN LIGHT AND ELECTRON-MICROSCOPY OF STRONG OBJECTS .2. UNIQUENESS AND STABILITY OF OBJECT RECONSTRUCTION PROCEDURES USING 2 DEFOCUSED IMAGES

H. A. Ferwerda, A.M.J. Huiser, A. Huiser, 1976 .

The Problem of Phase Retrieval in Light and Electron Microscopy of Strong Objects: II. On the unique

H. A. Ferwerda, A. Huiser, 1976 .

PROBLEM OF PHASE RETRIEVAL IN LIGHT AND ELECTRON-MICROSCOPY OF STRONG OBJECTS .3. DEVELOPMENTS OF METHODS FOR NUMERICAL-SOLUTION

H. A. Ferwerda, P. Vantoorn, 1976 .

Phase retrieval in imaging.

H. A. Ferwerda, H A Ferwerda, 1988, Applied optics.

Fundamental aspects of the phase retrieval problem

H. A. Ferwerda, 1980 .

Discussion of a ‘‘coherent artifact’’ in four‐wave mixing experiments

H. A. Ferwerda, J. Terpstra, D. Wiersma, 1989 .

Derivation of the equation for an ultrashort pulse in a fibre

H. A. Ferwerda, B. Hoenders, J. Nijhof, 1995 .

Statistical Aspects of Image Handling in Low-Dose Electron Microscopy of Biological Material

Cornelis H. Slump, H. A. Ferwerda, Hedzer A. Ferwerda, 1986 .

Frits Zernike--life and achievements

H. A. Ferwerda, 1993 .

On a convergent model of quantum electrodynamics

H. A. Ferwerda, 1963 .

Scattering and absorption of turbid materials determined from reflection measurements. 1: theory.

H. A. Ferwerda, H. Ferwerda, R. Groenhuis, 1983, Applied optics.

1984 European conference on optics, optical systems and applications

H. A. Ferwerda, B. Bolger, 1985 .

Fully Relativistic Treatment of Electron-optical Image Formation Based on the Dirac Equation

H. A. Ferwerda, C. Slump, B. Hoenders, 1986 .

The Fully Relativistic Foundation of Linear Transfer Theory in Electron Optics Based on the Dirac Equation

H. A. Ferwerda, C. Slump, B. Hoenders, 1986 .

Scattering and absorption of turbid materials determined from reflection measurements. 2: measuring method and calibration.

R A Groenhuis, H. A. Ferwerda, H. Ferwerda, 1983, Applied optics.

Coherence of illumination in electron microscopy

H. A. Ferwerda, 1980 .