Stephane Bronckers
发表
Yves Rolain,
Gerd Vandersteen,
Geert Van der Plas,
2010,
IEEE Transactions on Instrumentation and Measurement.
Jonathan Borremans,
Jan Craninckx,
Piet Wambacq,
2008,
2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers.
Luca Benini,
Federico Angiolini,
Paresh Limaye,
2010,
IEEE Journal of Solid-State Circuits.
Yves Rolain,
Jonathan Borremans,
Piet Wambacq,
2008,
2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers.
Paresh Limaye,
Bart Vandevelde,
Eric Beyne,
2010,
2010 IEEE International Solid-State Circuits Conference - (ISSCC).
Jonathan Borremans,
Andre Bourdoux,
Piet Wambacq,
2009,
2009 Annual IEEE Compound Semiconductor Integrated Circuit Symposium.
Paresh Limaye,
Bart Vandevelde,
Eric Beyne,
2010,
Proceedings of 2010 International Symposium on VLSI Technology, System and Application.
Yves Rolain,
Gerd Vandersteen,
Petr Dobrovolný,
2006,
Proceedings of the Design Automation & Test in Europe Conference.
Yves Rolain,
Gerd Vandersteen,
Geert Van der Plas,
2009,
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
Yves Rolain,
Gerd Vandersteen,
Geert Van der Plas,
2009,
IEEE Transactions on Instrumentation and Measurement.
Simulation methodology and experimental verification for the analysis of substrate noise on LC-VCO's
Yves Rolain,
Gerd Vandersteen,
Geert Van der Plas,
2007,
2007 Design, Automation & Test in Europe Conference & Exhibition.