Kanad Chakraborty

发表

An efficient, bus-layout based method for early diagnosis of bussed driver shorts in printed circuit boards

Pinaki Mazumder, Kanad Chakraborty, 1996, ICCAD 1996.

A physical design tool for built-in self-repairable RAMs

Pinaki Mazumder, Anurag Gupta, Kanad Chakraborty, 2001, IEEE Trans. Very Large Scale Integr. Syst..

Testing and Reliability Techniques for High-Bandwidth Embedded RAMs

Kanad Chakraborty, K. Chakraborty, 2004, J. Electron. Test..

Data-Driven DPPM Estimation and Adaptive Fault Coverage Calibration Using MATLAB®

Vishwani D. Agrawal, Kanad Chakraborty, 2012, J. Electron. Test..

A MATLAB-based technique for defect level estimation using data mining of test fallout data versus fault coverage

Kanad Chakraborty, 2010, 2010 11th International Symposium on Quality Electronic Design (ISQED).

A polynomial-time optimization algorithm for a rectilinear partitioning problem with applications in VLSI design automation

Kanad Chakraborty, Maharaj Mukherjee, K. Chakraborty, 2002, Inf. Process. Lett..

Novel algorithms for placement of rectangular covers for mask inspection in advanced lithography and other VLSI design applications

Kanad Chakraborty, Maharaj Mukherjee, Alexey Lvov, 2006, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Response to letter by Q. Hu and D. B. Hertz

Kishan G. Mehrotra, Sanjay Ranka, Chilukuri K. Mohan, 1994, Neural Networks.

Testing and Testable Design of High-Density Random-Access Memories

Pinaki Mazumder, Kanad Chakraborty, 1996 .

A physical design tool for built-in self-repairable static RAMs

Pinaki Mazumder, Anurag Gupta, Kanad Chakraborty, 1999, Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078).

Congestion mitigation during placement

Kanad Chakraborty, Natesan Venkateswaran, 1999, Proceedings Ninth Great Lakes Symposium on VLSI.

An efficient, bus-layout based method for early diagnosis of bussed driver shorts in printed circuit boards

Pinaki Mazumder, Kanad Chakraborty, 1996, Proceedings of International Conference on Computer Aided Design.

New March Tests for Multiport RAM Devices

Pinaki Mazumder, Kanad Chakraborty, P. Mazumder, 2000, J. Electron. Test..

Bisramgen: a silicon complier for built-in self-repairable random-access memories

Kanad Chakraborty, 1997 .

Built-in Self-Testing and Design for Testability

Pinaki Mazumder, Kanad Chakraborty, 1996 .

A programmable boundary scan technique for board-level, parallel functional duplex march testing of word-oriented multiport static RAMs

Pinaki Mazumder, Kanad Chakraborty, 1997, Proceedings European Design and Test Conference. ED & TC 97.

Efficient techniques for noise characterization of sequential cells and macros

Kanad Chakraborty, Bingxiong Xu, Lun Ye, 2006, 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06).

A silicon compiler for fault-tolerant ROMs

Pinaki Mazumder, Anurag Gupta, Kanad Chakraborty, 1998, Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223).

Novel Self-Timed, Pipelined Clock Scan Architecture

Kanad Chakraborty, James E. Kelly, Brian P. Evans, 2013, J. Electron. Test..

A Randomized Greedy Algorithm for the Pattern Fill Problem for DFM Applications

Kanad Chakraborty, Maharaj Mukherjee, 2008, 9th International Symposium on Quality Electronic Design (isqed 2008).

Transformational placement and synthesis

Leon Stok, Prabhakar Kudva, Kanad Chakraborty, 2000, DATE '00.

FTROM: A Silicon Compiler for Fault-tolerant ROMs

Pinaki Mazumder, Anurag Gupta, Kanad Chakraborty, 1998, Integr..

Forecasting the behavior of multivariate time series using neural networks

Kishan G. Mehrotra, Sanjay Ranka, Chilukuri K. Mohan, 1992, Neural Networks.

Technology and layout-related testing of static random-access memories

Pinaki Mazumder, Kanad Chakraborty, 1994, J. Electron. Test..