J. J. Wang

User verify and disturb mechanisms in a 65nm flash FPGA

Chenming Hu, John McCollum, Esmat Hamdy, 2011, 2011 IEEE International Integrated Reliability Workshop Final Report.

Behavior-Based Intelligent Robotic Technologies in Industrial Applications

H. Zhang, J. J. Wang, Z. X. Gan, 2007 .

Correlation between channel hot-electron degradation and radiation-induced interface trapping in N-channel LDD devices

E. E. King, J. J. Wang, L. Palkuti, 1991 .

Radiation effects in FPGAs

J. J. Wang, J J Wang, 2003 .