Christina Seidleck

发表

Single event effect proton and heavy ion test results for candidate spacecraft electronics

Cheryl J. Dale, Paul W. Marshall, Kenneth A. LaBel, 1994, Workshop Record. 1994 IEEE Radiation Effects Data Workshop.

Single event effect ground test results for a fiber optic data interconnect and associated electronics

Kenneth A. LaBel, E. G. Stassinopoulos, M. M. Gates, 1994 .

Preliminary ground test radiation results of NASA's MPTB dual-rate 1773 experiment

Donald Johnson, Cheryl J. Dale, Eric Y. Chan, 1996, Optics & Photonics.

Current single event effect test results for candidate spacecraft electronics

Cheryl J. Dale, Paul W. Marshall, Kenneth A. LaBel, 1996, 1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference.

Advanced CMOS Radiation Effects Testing Analysis

Kenneth A. LaBel, Jonathan A. Pellish, Anthony M. Phan, 2014 .

Single Event Effect Testing of the Micron MT46V128M8

Michael J. Campola, Anthony M. Phan, Christina Seidleck, 2017 .

Proton-induced transients in optocouplers: in-flight anomalies, ground irradiation test, mitigation and implications

E. G. Stassinopoulos, Paul W. Marshall, Kenneth A. LaBel, 1997 .

Single event effect test results for candidate spacecraft electronics

E. G. Stassinopoulos, Paul W. Marshall, Kenneth A. LaBel, 1997, 1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference.

Radiation effect characterization and test methods of single-chip and multi-chip stacked 16 Mbit DRAMs

Paul W. Marshall, Kenneth A. LaBel, M. M. Gates, 1996 .

On the suitability of fiber optic data links in the space radiation environment: a historical and scaling technology perspective

Paul W. Marshall, Melanie N. Ott, Kenneth A. LaBel, 1998, 1998 IEEE Aerospace Conference Proceedings (Cat. No.98TH8339).

Implications of single event effect characterization of hybrid DC-DC converters and a solid state power controller

Kenneth A. LaBel, K. Castell, R. K. Barry, 1995 .

ct Characterization and Test Methods of Single-Chip and Multi-Chip Stacked 16Mbit DRAMs

Consultant, Paul W. Marshall, Kenneth A. LaBel, 1996 .

Comparison of MIL-STD-1773 fiber optic data bus terminals: single event proton test irradiation, in-flight space performance, and prediction techniques

K. A. LaBel, Paul W. Marshall, Cheryl J. Marshall, 1997 .

Investigation of Current Spike Phenomena during Heavy Ion Irradiation of NAND Flash Memories

Farokh Irom, Kenneth A. LaBel, Timothy R. Oldham, 2010, 2011 IEEE Radiation Effects Data Workshop.

Heavy Ion Irradiation Fluence Dependence for Single-Event Upsets in a NAND Flash Memory

Kenneth A. LaBel, Dakai Chen, Raymond L. Ladbury, 2017, IEEE Transactions on Nuclear Science.

Single event upset rates on 1 Mbit and 256 Kbit memories: CRUX experiment on APEX

Kenneth A. LaBel, E. G. Stassinopoulos, M. Wennersten, 1995 .