John Hoffnagle

Experimental result and simulation analysis for the use of pixelated illumination from source mask optimization for 22nm logic lithography process

Scott Halle, Bernhard Kneer, Emily Gallagher, 2009, Advanced Lithography.

Portable low power cavity ring-down spectrometer for precise measurement of carbon dioxide, methane and water vapor

John Hoffnagle, Yonggang He, Derek Fleck, 2016, SPIE Commercial + Scientific Sensing and Imaging.