Kyul Ko

Variability-Aware Machine Learning Strategy for 3-D NAND Flash Memories

Jang Kyu Lee, Kyul Ko, Hyungcheol Shin, 2020, IEEE Transactions on Electron Devices.

Comparison of work function variation between FinFET and 3D stacked nanowire FET devices for 6-T SRAM reliability

Myounggon Kang, Hyungcheol Shin, Dokyun Son, 2017 .

Analysis and Comparison of Intrinsic Characteristics for Single and Multi-channel Nanoplate Vertical FET Devices

Myounggon Kang, Hyungcheol Shin, Min-Soo Kim, 2017 .

Prediction of Process Variation Effect for Ultrascaled GAA Vertical FET Devices Using a Machine Learning Approach

Myounggon Kang, Jongwook Jeon, Hyungcheol Shin, 2019, IEEE Transactions on Electron Devices.

Compact Model Strategy of Metal-Gate Work-Function Variation for Ultrascaled FinFET and Vertical GAA FETs

Myounggon Kang, Hyungcheol Shin, Jongwook Jeon, 2019, IEEE Transactions on Electron Devices.