Dominique Pons

Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluation

Olivier Vendier, Hervé Blanck, R. Petersen, 2001, Microelectron. Reliab..

Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology

Olivier Vendier, Hervé Blanck, Jan D'Haen, 2002, Microelectron. Reliab..