Y.J. Wang

Characterization and model of on-chip flicker noise with deep Nwell (DNW) isolation for 130nm and beyond SOC

M.T. Yang, D.C.W. Kuo, C.W. Kuo, 2005, Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005..

Adjacent-Reference and Self-Reference Sensing Scheme with Novel Orthogonal Wiggle MRAM Cell

Y.H. Wang, M.-J. Tsai, W.C. Chen, 2006, 2006 International Electron Devices Meeting.

BSIM4 high-frequency model verification for 0.13 /spl mu/m RF-CMOS technology

S.P. Voinigescu, M.T. Yang, M. Tazlauanu, 2004, 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535).

45nm low power CMOS logic compatible embedded STT MRAM utilizing a reverse-connection 1T/1MTJ cell

Luan Tran, S.H. Kang, W.C. Chen, 2009, 2009 IEEE International Electron Devices Meeting (IEDM).

Foundry 0.13 /spl mu/m CMOS modeling for MS//spl mu/wave SOC design at 10 GHz and beyond

S.P. Voinigescu, M.T. Yang, D.C.W. Kuo, 2004, 2004 IEE Radio Frequency Integrated Circuits (RFIC) Systems. Digest of Papers.

Statistical characterization and Monte-Carlo simulation of low-frequency noise variations in foundry AMS/RF CMOS technology

M.T. Yang, A.K.L. Chang, C.W. Kuo, 2006, Digest of Papers. 2006 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems.

Characterization and model of high quality factor and broadband integrated inductor on Si-substrate

M.T. Yang, P.P.C. Ho, Y.T. Chia, 2003, IEEE MTT-S International Microwave Symposium Digest, 2003.