S. Liu

Characterization and model of on-chip flicker noise with deep Nwell (DNW) isolation for 130nm and beyond SOC

M.T. Yang, D.C.W. Kuo, C.W. Kuo, 2005, Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005..

A Novel Approach to Link Process Parameters to BSIM Model Parameters

A.N. Chandorkar, S. Mande, Yi-Ming Sheu, 2009, IEEE Transactions on Semiconductor Manufacturing.

A Novel Transmission-Line Deembedding Technique for RF Device Characterization

Chung-Yu Wu, Chin-Wei Kuo, S. Liu, 2009, IEEE Transactions on Electron Devices.

3D IC heterogeneous integration of GPS RF receiver, baseband, and DRAM on CoWoS with system BIST solution

H. C. Lin, M. F. Chen, Doug Yu, 2013, 2013 Symposium on VLSI Circuits.