James C. Weldon

Layout and bias options for maximizing Vt1 in cascoded NMOS output buffers

James W. Miller, Michael G. Khazhinsky, James C. Weldon, 2001, Microelectron. Reliab..

ESD protection of single output buffers in advanced CMOS technologies

James W. Miller, Michael Stockinger, Michael G. Khazhinsky, 2006 .

Modular, portable, and easily simulated ESD protection networks for advanced CMOS technologies

Cynthia A. Torres, James W. Miller, Michael Stockinger, 2001, 2001 Electrical Overstress/Electrostatic Discharge Symposium.

Advanced rail clamp networks for ESD protection

Cynthia A. Torres, James W. Miller, Michael Stockinger, 2005, Microelectron. Reliab..

Comprehensive ESD protection approach in advanced CMOS SOI technologies

James W. Miller, Michael Stockinger, Michael G. Khazhinsky, 2006 .