R. Wasielewski

Surface chemistry of Ru: relevance to optics lifetime in EUVL

A. Ciszewski, R. Wasielewski, Boris V. Yakshinskiy, 2007, European Mask and Lithography Conference.

Diagnostic usefulness of granulometric analyses of chips distribution while sawing of wood

Kazimierz Orłowski, L. Dzurenda, R. Wasielewski, 2010 .

Surface characterization of TiO2 thin films obtained by high-energy reactive magnetron sputtering

Jaroslaw Domaradzki, Damian Wojcieszak, Danuta Kaczmarek, 2008 .

Fabrication of submicron-sized features in InP/InGaAsP/AlGaInAs quantum well heterostructures by optimized inductively coupled plasma etching with Cl2/Ar/N2 chemistry

R. Wasielewski, R. Dylewicz, A. C. Bryce, 2010 .