Myoungkwan Cho

RTS noise reduction of 1Y-nm floating gate NAND flash memory using process optimization

Sungho Kim, Jinwoong Kim, Gil-Bok Choi, 2015, 2015 IEEE International Reliability Physics Symposium.

Novel integration technologies for improving reliability in NAND flash memory

Gihyun Bae, Sungwook Park, Myoungkwan Cho, 2012, 2012 IEEE International Symposium on Circuits and Systems.

Challenges and limitations of NAND flash memory devices based on floating gates

Sunghoon Cho, Gihyun Bae, Sungwook Park, 2012, 2012 IEEE International Symposium on Circuits and Systems.