Campbell Millar

发表

Progress on carbon nanotube BEOL interconnects

Aida Todri, B. Uhlig, J. Liang, 2018, 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: A review

Jie Ding, A. Asenov, Salvatore M. Amoroso, 2014, Microelectronics and reliability.

Accurate simulations of the interplay between process and statistical variability for nanoscale FinFET-based SRAM cell stability

Andrew R. Brown, A. Asenov, Binjie Cheng, 2014, 2014 44th European Solid State Device Research Conference (ESSDERC).

Extended Analysis of the $Z^{2}$ -FET: Operation as Capacitorless eDRAM

Yong-Tae Kim, Sorin Cristoloveanu, Asen Asenov, 2017, IEEE Transactions on Electron Devices.

Grid infrastructures for the electronics domain: requirements and early prototypes from an EPSRC pilot project

Richard O. Sinnott, Asen Asenov, Scott Roy, 2007 .

Towards a Grid-Enabled Simulation Framework for Nano-CMOS Electronics

Richard O. Sinnott, A. Asenov, Gordon Stewart, 2007, Third IEEE International Conference on e-Science and Grid Computing (e-Science 2007).

TCAD based Design-Technology Co-Optimisations in advanced technology nodes

A. Asenov, Campbell Millar, Ricardo Borges, 2017, 2017 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA).

Circuit design perspectives for Ge FinFET at 10nm and beyond

Robert C. Aitken, Andrew R. Brown, A. Asenov, 2015, Sixteenth International Symposium on Quality Electronic Design.

An accurate compact modelling approach for statistical ageing and reliability

Asen Asenov, Campbell Millar, Jie Ding, 2013, 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).

Statistical enhancement of combined simulations of RDD and LER variability: What can simulation of a 105 sample teach us?

Asen Asenov, Scott Roy, Gareth Roy, 2009, 2009 IEEE International Electron Devices Meeting (IEDM).

Hierarchical variability-aware compact models of 20nm bulk CMOS

Asen Asenov, Liping Wang, Xingsheng Wang, 2015, 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).

Statistical simulation of random dopant induced threshold voltage fluctuations for 35 nm channel length MOSFET

A. Asenov, Scott Roy, Gareth Roy, 2008, Microelectron. Reliab..

The evolution of standard cell libraries for future technology nodes

A. Asenov, Andrew M. Tyrrell, Scott Roy, 2011, Genetic Programming and Evolvable Machines.

Statistical Variability and Reliability and the Impact on Corresponding 6T-SRAM Cell Design for a 14-nm Node SOI FinFET Technology

Andrew R. Brown, A. Asenov, Binjie Cheng, 2013, IEEE Design & Test.

Evaluating the accuracy of SRAM margin simulation through large scale Monte-Carlo simulations with accurate compact models

A. Asenov, Scott Roy, Campbell Millar, 2013, Proceedings of 2013 International Conference on IC Design & Technology (ICICDT).

SRAM device and cell co-design considerations in a 14nm SOI FinFET technology

Sani R. Nassif, Andrew R. Brown, A. Asenov, 2013, 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013).

Influence of Transistors With BTI-Induced Aging on SRAM Write Performance

Asen Asenov, Campbell Millar, Jie Ding, 2015, IEEE Transactions on Electron Devices.

FinFET Centric Variability-Aware Compact Model Extraction and Generation Technology Supporting DTCO

Asen Asenov, Binjie Cheng, Xingsheng Wang, 2015, IEEE Transactions on Electron Devices.

Supercomputing at Work in the nanoCMOS Electronics Domain

Richard O. Sinnott, A. Asenov, Campbell Millar, 2008, ERCIM News.

Statistical variability in 14-nm node SOI FinFETs and its impact on corresponding 6T-SRAM cell design

Andrew R. Brown, A. Asenov, Binjie Cheng, 2012, 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC).

Modelling circuit performance variations due to statistical variability: Monte Carlo static timing analysis

Mark Zwolinski, Zhenyu Liu, A. Asenov, 2011, 2011 Design, Automation & Test in Europe.

Statistical-Variability Compact-Modeling Strategies for BSIM4 and PSP

A. Asenov, Scott Roy, Binjie Cheng, 2010, IEEE Design & Test of Computers.

Accurate Simulation of Transistor-Level Variability for the Purposes of TCAD-Based Device-Technology Cooptimization

Asen Asenov, Andrew R. Brown, Binjie Cheng, 2015, IEEE Transactions on Electron Devices.

Variability Aware Simulation Based Design- Technology Cooptimization (DTCO) Flow in 14 nm FinFET/SRAM Cooptimization

Sani R. Nassif, Asen Asenov, Binjie Cheng, 2015, IEEE Transactions on Electron Devices.

Variability-aware compact model strategy for 20-nm bulk MOSFETs

Asen Asenov, Liping Wang, Binjie Cheng, 2014, 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).

Impact of statistical variability and charge trapping on 14 nm SOI FinFET SRAM cell stability

Sani R. Nassif, Andrew R. Brown, A. Asenov, 2013, 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC).

Modeling and simulation of transistor and circuit variability and reliability

Andrew R. Brown, A. Asenov, Scott Roy, 2010, IEEE Custom Integrated Circuits Conference 2010.

Data Management of nanometreScale CMOS Device Simulations

Richard O. Sinnott, G. Stewart, Asen Asenov, 2009 .

Investigation of SRAM using BTI-aware statistical compact models

Jie Ding, A. Asenov, Campbell Millar, 2013, 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC).

Secure, Performance-Oriented Data Management for nanoCMOS Electronics

C. Davenhall, Richard O. Sinnott, A. Asenov, 2008, 2008 IEEE Fourth International Conference on eScience.

Supporting Security-Oriented, Collaborative nanoCMOS Electronics Research

Richard O. Sinnott, Gordon Stewart, Campbell Millar, 2008, ICCS.

Statistical aspects of FinFET based SRAM metrics subject to process and statistical variability

Asen Asenov, Binjie Cheng, Xingsheng Wang, 2014, 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT).

Capturing intrinsic parameter fluctuations using the PSP compact model

A. Asenov, Scott Roy, Binjie Cheng, 2010, 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010).

Process informed accurate compact modelling of 14-nm FinFET variability and application to statistical 6T-SRAM simulations

Asen Asenov, Liping Wang, Xingsheng Wang, 2016, 2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).

Integrating Security Solutions to Support nanoCMOS Electronics Research

C. Davenhall, Richard O. Sinnott, A. Asenov, 2008, 2008 IEEE International Symposium on Parallel and Distributed Processing with Applications.

Meeting the design challenges of nanoCMOS electronics

Mark Zwolinski, Richard O. Sinnott, Asen Asenov, 2007 .

An advanced statistical compact model strategy for SRAM simulation at reduced VDD

A. Asenov, Scott Roy, Campbell Millar, 2012, 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC).

Enabling Cutting-Edge Semiconductor Simulation through Grid Technology

Richard O. Sinnott, A. Asenov, Gordon Stewart, 2009, LSSC.

${Z}^{\textsf {2}}$ -FET as Capacitor-Less eDRAM Cell For High-Density Integration

Sorin Cristoloveanu, Asen Asenov, Philippe Galy, 2017, IEEE Transactions on Electron Devices.

Benchmarking statistical compact modeling strategies for capturing device intrinsic parameter fluctuations in BSIM4 and PSP

Asen Asenov, Binjie Cheng, Gareth Roy, 2010 .

From devices to circuits: modelling the performance of 5nm nanosheets

Andrew R. Brown, Sylvain Barraud, Liping Wang, 2019, 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).

Simulation for statistical variability in realistic 20nm MOSFET

Asen Asenov, Andrew R. Brown, Campbell Millar, 2014, 2014 15th International Conference on Ultimate Integration on Silicon (ULIS).

Evaluation of statistical variability in 32 and 22 nm technology generation LSTP MOSFETs

Asen Asenov, Andrew R. Brown, Binjie Cheng, 2009, ESSDERC 2009.

A Survey of Carbon Nanotube Interconnects for Energy Efficient Integrated Circuits

Asen Asenov, Toufik Sadi, Andrew R. Brown, 2015, IEEE Circuits and Systems Magazine.

Excessive Over-Relaxation Method for Multigrid Poisson Solvers

Asen Asenov, Campbell Millar, Jeremy R. Watling, 2002 .