Myung-Hee Nam

Effects of buried oxide thickness on electrical characteristics of LOCOS-isolated thin-film SOI MOSFETs

Jong-Wook Lee, Myung-Hee Nam, Jeong-Hee Oh, 1998, 1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199).

Effects of buried oxide stress on thin-film silicon-on-insulator metal-oxide-semiconductor field-effect-transistor

Myung-Hee Nam, Jeong-Hee Oh, Ji-Woon Yang, 1998 .

64 Mbit SOI-DRAM technologies using body-contacted (BC) structure

Myung-Hee Nam, Ji-Woon Yang, Won-Chang Lee, 1997, 1997 IEEE International SOI Conference Proceedings.

Body-contacted SOI MOSFET structure with fully bulk CMOS compatible layout and process

Myung-Hee Nam, Ji-Woon Yang, Yo-Hwan Koh, 1997 .