J. Rosa

A conventional 45nm CMOS node low-cost platform for general purpose and low power applications

T. Skotnicki, B. Tavel, M. Bidaud, 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

Improved precision methodology for access resistance extraction using Kelvin test structures

J. Rosa, G. Morin, A. Cros, 2012, 2012 IEEE International Conference on Microelectronic Test Structures.

Evolution of low frequency noise and noise variability through CMOS bulk technology nodes

Gerard Ghibaudo, J. Rosa, Sebastien Haendler, 2013 .

Scaling of SiGe BiCMOS Technologies for Applications above 100 GHz

E. Dacquay, I. Sarkas, A. Balteanu, 2012, 2012 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS).

New methodology for drain current local variability characterization using Y function method

G. Ghibaudo, N. Planes, J. Rosa, 2013, 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS).

Low frequency noise variability in high-k/metal gate stack 28nm bulk and FD-SOI CMOS transistors

G. Ghibaudo, N. Planes, M. Haond, 2011, 2011 International Electron Devices Meeting.

Electrical characterization and mechanical modeling of process induced strain in 65 nm CMOS technology

S. Orain, C. Ortolland, P. Stolk, 2004, Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850).

High field transport characterization in nano MOSFETs using 10GHz capacitance measurements

G. Ghibaudo, J. Rosa, D. Gloria, 2013, 2013 IEEE International Electron Devices Meeting.

Evolution of low frequency noise and noise variability through CMOS bulk technology nodes

G. Ghibaudo, J. Rosa, S. Haendler, 2013, 2013 22nd International Conference on Noise and Fluctuations (ICNF).