J. Rosa
发表
T. Skotnicki,
B. Tavel,
M. Bidaud,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
J. Rosa,
G. Morin,
A. Cros,
2012,
2012 IEEE International Conference on Microelectronic Test Structures.
Gerard Ghibaudo,
J. Rosa,
Sebastien Haendler,
2013
.
E. Dacquay,
I. Sarkas,
A. Balteanu,
2012,
2012 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS).
G. Ghibaudo,
N. Planes,
J. Rosa,
2013,
2013 IEEE International Conference on Microelectronic Test Structures (ICMTS).
G. Ghibaudo,
N. Planes,
M. Haond,
2011,
2011 International Electron Devices Meeting.
S. Orain,
C. Ortolland,
P. Stolk,
2004,
Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850).
G. Ghibaudo,
J. Rosa,
D. Gloria,
2013,
2013 IEEE International Electron Devices Meeting.
G. Ghibaudo,
J. Rosa,
S. Haendler,
2013,
2013 22nd International Conference on Noise and Fluctuations (ICNF).