Angelo Giglia

发表

Introduction of Zr in Mg/Co nanometric periodic multilayers

Jingtao Zhu, Zhanshan Wang, Karine Le Guen, 2011, International Conference on Thin Film Physics and Applications.

Study of Cr/Sc-based multilayer reflecting mirrors using soft x-ray reflectivity and standing wave-enhanced x-ray fluorescence (Erratum)

Franck Delmotte, Jean-Michel André, Philippe Jonnard, 2017 .

Quantitative modelization of particle emission from excited solids: application to spectroscopic diagnostics of buried interfaces in multilayer

Angelo Giglia, Stefano Nannarone, N. Mahne, 2007, SPIE Optics + Optoelectronics.

Polarizers tuned at key far-UV spectral lines for space instrumentation

Silvano Fineschi, Gerardo Capobianco, Angelo Giglia, 2017, Optics + Optoelectronics.

Efficiency of gratings in the conical diffraction mounting for an EUV time-compensated monochromator

Luca Poletto, Nicola Mahne, Angelo Giglia, 2004, SPIE Optics + Photonics.

Optical characterization of SiO2 thin films using universal dispersion model over wide spectral range

Angelo Giglia, David Nečas, Daniel Franta, 2016, SPIE Photonics Europe.

High efficiency carbon-based multilayers for LAMP at 250 eV

Zhanshan Wang, Qiushi Huang, Li Jiang, 2015, SPIE Optical Engineering + Applications.

Polarizers for a spectral range centered at 121.6 nm operating by reflectance or by transmittance

Silvano Fineschi, Gerardo Capobianco, Fabio Frassetto, 2015, Europe Optics + Optoelectronics.

Transmittance and extinction coefficient of Ce films measured in situ in the extreme ultraviolet and soft x-rays

Luca Poletto, Angelo Giglia, Stefano Nannarone, 2006, SPIE Optics + Photonics.

Multilayer reflective polarizers for the far ultraviolet

Silvano Fineschi, Gerardo Capobianco, Fabio Frassetto, 2013, Europe Optics + Optoelectronics.

Characterizing and modeling electrical response to light for metal-based EUV photoresists

Geert Vandenberghe, John J. Biafore, Danilo De Simone, 2016, SPIE Advanced Lithography.

Determination of the transmittance and extinction coefficient of Yb films in the 23-1700 eV range

Luca Poletto, Angelo Giglia, Stefano Nannarone, 2006, SPIE Optics + Photonics.

Synchrotron x-ray transmission measurements and modeling of filters investigated for Athena

Philippe Laurent, Angelo Giglia, Philippe Ferrando, 2020 .

Dispersion model for optical thin films applicable in wide spectral range

Angelo Giglia, David Nečas, Daniel Franta, 2015, SPIE Optical Systems Design.

XAS photoresists electron/quantum yields study with synchrotron light

Alessandro Vaglio Pret, John J. Biafore, Angelo Giglia, 2015, Advanced Lithography.

Monochromator for the synchrotron radiation beamline X-MOSS at ELETTRA

Giampiero Naletto, Angelo Giglia, Stefano Nannarone, 2001, SPIE Optics + Photonics.

Optical constants of e-beam evaporated titanium dioxide thin films in the 25.5- to 612-eV energy region

Piergiorgio Nicolosi, Angelo Giglia, Marco Nardello, 2016 .

Test of a multilayer-coated EUV grating for I-IV order spectroscopic measurements of the solar corona

Giampiero Naletto, Piergiorgio Nicolosi, Silvano Fineschi, 2013, Optics & Photonics - Optical Engineering + Applications.

Phase characterization of attosecond multilayer mirrors: from EUV to soft x-rays

Franck Delmotte, Angelo Giglia, Evgueni Meltchakov, 2014, Optics & Photonics - Optical Engineering + Applications.

Advances in far-ultraviolet reflective and transmissive coatings for space applications

Silvano Fineschi, Gerardo Capobianco, Angelo Giglia, 2016, Astronomical Telescopes + Instrumentation.

Performances and stability of Sc/Si multilayers with barrier layers for wavelengths around 46 nm

Francoise Bridou, Franck Delmotte, Arnaud Jerome, 2005, SPIE Optical Systems Design.

Pushing the high-energy limit of plasmonics.

Angelo Giglia, Stefano Nannarone, Alessandro Alabastri, 2014, ACS nano.

Determination of optical constants of scandium films in the 20-1000 eV range.

Mónica Fernández-Perea, Luca Poletto, Angelo Giglia, 2006, Journal of the Optical Society of America. A, Optics, image science, and vision.

Phase measurement of soft x-ray multilayer mirrors.

Franck Delmotte, Angelo Giglia, Stefano Nannarone, 2015, Optics letters.

Deposition and characterization of B4C/CeO2 multilayers at 6.x nm extreme ultraviolet wavelengths

Piergiorgio Nicolosi, Larissa Juschkin, Sascha Brose, 2016 .

Deep ultraviolet plasmon resonance in aluminum nanoparticle arrays.

Hai-Lung Dai, Angelo Giglia, Stefano Nannarone, 2013, ACS nano.

Broadband multilayer optics for ultrafast EUV absorption spectroscopy with free electron laser radiation

Angelo Giglia, Stefano Nannarone, Maria Guglielmina Pelizzo, 2015 .

Reflective and transmissive broadband coating polarizers in a spectral range centered at 121.6 nm

Silvano Fineschi, Gerardo Capobianco, Fabio Frassetto, 2014 .

Structural and electronic properties of anisotropic ultrathin organic films from dichroic resonant soft x-ray reflectivity

Angelo Giglia, Stefano Nannarone, Konstantin Koshmak, 2014 .

Improvement of interface structure and polarization performance of Co/C multilayers by incorporation of nitrogen.

Qiushi Huang, Angelo Giglia, Rui She, 2016, Optics express.

Enhancement of soft X-ray reflectivity and interface stability in nitridated Pd/Y multilayer mirrors.

Qiushi Huang, Dechao Xu, Philippe Jonnard, 2015, Optics express.

Shaping of single-cycle sub-50-attosecond pulses with multilayer mirrors

Franck Delmotte, Nicola Mahne, Angelo Giglia, 2012 .