P. Nelle

A new test circuit for the matching characterization of npn bipolar transistors

M. Stecher, U. Schaper, U. Kollmer, 2004, Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516).

On the Way to Zero Defect of Plastic-Encapsulated Electronic Power Devices—Part I: Metallization

M. Stecher, P. Alpern, H. Gunther, 2009, IEEE Transactions on Device and Materials Reliability.

On the Way to Zero Defect of Plastic-Encapsulated Electronic Power Devices—Part III: Chip Coating, Passivation, and Design

M. Stecher, P. Alpern, H. Gunther, 2009, IEEE Transactions on Device and Materials Reliability.