B. De Masi

The effect of nano-scale interaction forces on the premature pull-in of real-life Micro-Electro-Mechanical Systems

Alberto Corigliano, R. Ardito, A. Frangi, 2012, Microelectron. Reliab..

Out of plane vs in plane flexural behaviour of thin polysilicon films: Mechanical characterization and application of the Weibull approach

Alberto Corigliano, B. De Masi, C. Riva, 2005, Microelectron. Reliab..