Brendan J. Griffin

Evaluating SEM performance from the contrast transfer function

David C. Joy, Joseph R. Michael, Brendan J. Griffin, 2010, Advanced Lithography.

Device metrology with high-performance scanning ion beams

David C. Joy, Bill Ward, Lewis Stern, 2007, SPIE Advanced Lithography.

Modeling for metrology with a helium beam

David C. Joy, Brendan J. Griffin, Ranjan Ramachandra, 2008, SPIE Advanced Lithography.

Length calibration standards for nano-manufacturing

David C. Joy, Brendan J. Griffin, Sachin Deo, 2007, SPIE NanoScience + Engineering.