Yunsheng Lu

Structure and metrology for a single-wire analog testability bus

Ramaswami Dandapani, Weiwei Mao, Ravi K. Gulati, 1994, Proceedings., International Test Conference.

Hard faults diagnosis in analog circuits using sensitivity analysis

Ramaswami Dandapani, Yunsheng Lu, 1993, Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium.

Test generation for linear analog circuits

R. Dandapani, Weiwei Mao, Yunsheng Lu, 1995, Proceedings of the IEEE 1995 Custom Integrated Circuits Conference.