Thomas Rinder

发表

Metrological characterization of an ARS sensor based on an elliptical mirror system and a calibrated CMOS photo detector array

Thomas Rinder, Hendrik Rothe, H. Rothe, 2001, Optics + Photonics.

Characterization of surfaces using neural pattern recognition methods based on BRDF and AFM measurements

Thomas Rinder, Hendrik Rothe, 1999, Optics & Photonics.

Investigations of smooth surfaces by measuring the BRDF with a stray light sensor in comparison with PSD curves evaluated from topography of large AFM scans

Thomas Rinder, Hendrik Rothe, Andre Kasper, 1999, Photonics West.

Performance limits of ARS sensors based on CMOS photodiode array

Thomas Rinder, Hendrik Rothe, H. Rothe, 2002, SPIE Optics + Photonics.

Current challenges for scaling of tunnel drainage systems – Modelling approaches, monitoring tools and prevention strategies / Aktuelle Herausforderungen bei der Versinterung von Tunneldränagen – Modellierungsansätze, Monitoringwerkzeuge und Präventionsstrategien

Peter Reichl, Thomas Rinder, Hanns Wagner, 2013 .

Modeling of an ARS sensor system in spatial and time domain

Thomas Rinder, Hendrik Rothe, 2002, SPIE Optics + Photonics.

Design problems of a calibrated BRDF sensor with respect to dynamic range, speed, and large angle of view

Thomas Rinder, Hendrik Rothe, Andre Kasper, 2000, SPIE Optics + Photonics.

Deducing light scatter from AFM measurements

Hendrik Rothe, Thomas Rinder, Cornelius Hahlweg, 2003, SPIE Optics + Photonics.

Estimation of performance limits of multipole method using parallel computing techniques

Hendrik Rothe, Thomas Rinder, Cornelius Hahlweg, 2003, SPIE Optics + Photonics.

Development review of an angle-resolved light scatter (ARS) sensor LARISSA

Thomas Rinder, Hendrik Rothe, 2003, SPIE Optics + Photonics.

Polarized light-scattering measurements of polished and etched steel surfaces

Thomas Rinder, Thomas A. Germer, Ht Rothe, 2000, SPIE Optics + Photonics.

Measuring the scatter distribution of PSL spheres on Si wafers using a fast calibrated CMOS photodetector array

Thomas Rinder, Hendrik Rothe, 2001, SPIE Optics + Photonics.

Comparison of PSD measurements using stray light sensors with PSD curves evaluated from topography of large AFM scans

Thomas Rinder, Hendrik Rothe, Dorothee Hueser, 1998, Optics & Photonics.

Localization of sub-100-nm particles on wafers with solid state detector arrays

Thomas Rinder, Hendrik Rothe, 2003, SPIE Optics + Photonics.