J. Craik

Decision support for test and debug areas in RF manufacturing

Krishnaswami Srihari, S. Balasubramanian, J. Arbulich, 2002, 27th Annual IEEE/SEMI International Electronics Manufacturing Technology Symposium.

Requirement specifications for an enterprise level collaborative, data collection, quality management and manufacturing tool for an EMS provider

K. Srihari, J. Craik, S. Bahl, 2002, 27th Annual IEEE/SEMI International Electronics Manufacturing Technology Symposium.