H. Schinagel

Applications of analog Change Coupled Devices (CCD's)

P. Christiansen, P. J. Gebhardt, G. Kohlbacher, 1983 .

Test structures and measurement techniques for the characterization of the dynamic behaviour of CMOS transistors on wafer in the GHz range

H. Schinagel, J. Hanseler, H. L. Zapf, 1992, ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures.